Definitions from Wikipedia (Conductive atomic force microscopy)
▸ noun: In microscopy, conductive atomic force microscopy or current sensing atomic force microscopy is a mode in atomic force microscopy that simultaneously measures the topography of a material and the electric current flow at the contact point of the tip with the surface of the sample.
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▸ noun: In microscopy, conductive atomic force microscopy or current sensing atomic force microscopy is a mode in atomic force microscopy that simultaneously measures the topography of a material and the electric current flow at the contact point of the tip with the surface of the sample.
▸ Words similar to conductive atomic force microscopy
▸ Usage examples for conductive atomic force microscopy
▸ Idioms related to conductive atomic force microscopy
▸ Wikipedia articles (New!)
▸ Words that often appear near conductive atomic force microscopy
▸ Rhymes of conductive atomic force microscopy
▸ Invented words related to conductive atomic force microscopy