A highly accelerated life test is a stress testing methodology for enhancing product reliability in which prototypes are stressed to a much higher degree than expected from actual use in order to identify weaknesses in the design or manufacture of the product.

a corner detection method, which could be used to extract feature points and later used to track and map objects in many computer vision tasks.

The highly accelerated stress test method was first proposed by Jeffrey E. Gunn, Sushil K. Malik, and Purabi M. Mazumdar of IBM.